US 12,476,099 B2
Ion analyzer
Yohei Toji, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Appl. No. 17/919,772
Filed by SHIMADZU CORPORATION, Kyoto (JP)
PCT Filed Apr. 24, 2020, PCT No. PCT/JP2020/017639
§ 371(c)(1), (2) Date Oct. 19, 2022,
PCT Pub. No. WO2021/214965, PCT Pub. Date Oct. 28, 2021.
Prior Publication US 2023/0197432 A1, Jun. 22, 2023
Int. Cl. H01J 49/16 (2006.01)
CPC H01J 49/167 (2013.01) 7 Claims
OG exemplary drawing
 
1. An ion analyzer comprising:
a first member fixed to an ion outflow port and provided with a fixing pin on one side and a pin hole on the other side sandwiching the ion outflow port;
a second member to be fixed to the first member, the second member including an ion flow controller configured to control movement of ions flowing out from the ion outflow port, the second member having a first concave part configured to engage with the fixing pin from a first direction perpendicular to an axis of the fixing pin, and a second concave part configured to engage with an insertion pin from a second direction different from the first direction, the insertion pin being inserted into the pin hole; and
a pin member having the insertion pin to be inserted into the pin hole, and a head part configured to sandwich and fix the second member with the first member.