US 12,474,190 B2
Envelope based sample correction for digital flow metrology
Amardeep Sathyanarayana, Austin, TX (US); Anand G. Dabak, Plano, TX (US); and David Patrick Magee, Allen, TX (US)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US)
Filed on Oct. 7, 2020, as Appl. No. 17/064,671.
Application 17/064,671 is a continuation of application No. 14/866,779, filed on Sep. 25, 2015, granted, now 10,830,619.
Claims priority of provisional application 62/160,324, filed on May 12, 2015.
Prior Publication US 2021/0018350 A1, Jan. 21, 2021
This patent is subject to a terminal disclaimer.
Int. Cl. G01F 1/66 (2022.01)
CPC G01F 1/662 (2013.01) 10 Claims
OG exemplary drawing
 
1. A system, comprising:
a first transducer operable to transmit a first signal having a first frequency at a first time and receive a second signal at a second time;
a second transducer operable to receive the first signal and transmit the second signal having the first frequency; and
a signal processing circuit communicatively coupled to the first transducer and the second transducer, the signal processing circuit operable to:
sample the first signal to produce a sampled first signal;
sample the second signal to produce a sampled second signal;
band pass filter the sampled first signal and the sampled second signal based on the first frequency to produce a filtered first signal and a filtered second signal;
determine a first envelope of the filtered first signal and a second envelope of the filtered second signal;
normalize the first envelope to form a normalized first envelope;
normalize the second envelope to form a normalized second envelope;
align the first normalized envelope with the second normalized envelope based on a first crossing point of the first normalized envelope with a threshold and a second crossing point of the second normalized envelope with the threshold to determine a time of flight;
determine an error based on alignment points associated with the first signal and the second signal;
determine a corrected time of flight based on the error and the time of flight; and
calculate a flow rate of a material based on the corrected time of flight.