US 12,471,862 B2
Phase-contrast X-ray imaging system for obtaining a dark-field image and a method therefor
Jan De Beenhouwer, Geraardsbergen (BE); and Jan Sijbers, Duffel (BE)
Assigned to IMEC VZW, Leuven (BE); and UNIVERSITEIT ANTWERPEN, Antwerp (BE)
Appl. No. 18/567,282
Filed by IMEC VZW, Leuven (BE); and UNIVERSITEIT ANTWERPEN, Antwerp (BE)
PCT Filed May 31, 2022, PCT No. PCT/EP2022/064694
§ 371(c)(1), (2) Date Dec. 5, 2023,
PCT Pub. No. WO2022/258429, PCT Pub. Date Dec. 15, 2022.
Claims priority of application No. 21178284 (EP), filed on Jun. 8, 2021.
Prior Publication US 2024/0260915 A1, Aug. 8, 2024
Int. Cl. A61B 6/00 (2024.01); A61B 6/40 (2024.01)
CPC A61B 6/482 (2013.01) [A61B 6/4035 (2013.01); A61B 6/484 (2013.01); A61B 6/5205 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A computer-implemented method for obtaining dark-field X-ray projection data of an object comprising:
obtaining a first set of X-ray projection data of the object acquired at a first energy spectrum; the first set of X-ray projection data comprising a first attenuation component, a first phase component, and a first dark-field component;
obtaining a second set of X-ray projection data of the object acquired at a second energy spectrum having a higher effective energy than the first energy spectrum; and
extracting dark-field projection data from the first set of X-ray projection data by the second set of X-ray projection data having a lower dark-field component contribution than the first set of X-ray projection data.