| CPC H01L 29/737 (2013.01) [H01L 21/0254 (2013.01); H01L 29/66318 (2013.01)] | 20 Claims |

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1. A method for producing a heterojunction bipolar transistor, the method comprising:
a first step of crystal-growing, over a first substrate in a following order with a main surface as a Group III polar surface,
an emitter contact layer comprising a nitride semiconductor that is made n-type,
an emitter layer comprising a nitride semiconductor having a bandgap larger than that of the nitride semiconductor of the emitter contact layer,
a base layer comprising an undoped nitride semiconductor having a bandgap smaller than that of the nitride semiconductor of the emitter layer,
a p-type base layer comprising the same nitride semiconductor as that of the base layer and made p-type,
a collector layer comprising a nitride semiconductor that has the same bandgap as that of the nitride semiconductor of the p-type base layer and that is made n-type, and
a sub-collector layer comprising the same nitride semiconductor as that of the collector layer and made n-type;
a second step of bonding the first substrate and a second substrate;
a third step of removing the first substrate to create a state in which the sub-collector layer, the collector layer, the p-type base layer, the base layer, the emitter layer, and the emitter contact layer are formed over the second substrate in this order with the main surface as a Group V polar surface;
a fourth step of patterning the emitter contact layer into a mesa shape;
a fifth step of forming a base electrode that is ohmic-connected to the p-type base layer on the emitter layer on a side of the mesa-shaped emitter contact layer; and
a sixth step of forming an emitter electrode on the mesa-shaped emitter contact layer.
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