US 12,142,616 B2
Light detector, light detection system, LIDAR device, and mobile body
Mariko Shimizu, Setagaya Tokyo (JP); Ikuo Fujiwara, Yokohama Kanagawa (JP); Keita Sasaki, Yokohama Kanagawa (JP); Kazuaki Okamoto, Yokohama Kanagawa (JP); Honam Kwon, Kawasaki Kanagawa (JP); and Kazuhiro Suzuki, Meguro Tokyo (JP)
Assigned to Kabushiki Kaisha Toshiba, Tokyo (JP)
Filed by KABUSHIKI KAISHA TOSHIBA, Tokyo (JP)
Filed on Feb. 24, 2022, as Appl. No. 17/680,184.
Claims priority of application No. 2021-075746 (JP), filed on Apr. 28, 2021.
Prior Publication US 2022/0352219 A1, Nov. 3, 2022
Int. Cl. H01L 27/146 (2006.01); G01S 7/481 (2006.01)
CPC H01L 27/14603 (2013.01) [G01S 7/4816 (2013.01); H01L 27/14636 (2013.01); H01L 27/14649 (2013.01); H01L 27/14685 (2013.01); H01L 27/1463 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A light detector, comprising:
a plurality of elements located in a cell region and arranged along a first direction and a second direction, the second direction crossing the first direction, each of the elements including
a first semiconductor region of a first conductivity type,
a second semiconductor region located on the first semiconductor region, the second semiconductor region being of the first conductivity type and including a higher first-conductivity-type impurity concentration than the first semiconductor region, and
a third semiconductor region located on the second semiconductor region, the third semiconductor region being of a second conductivity type;
a plurality of separation parts located respectively around the elements in a first plane parallel to the first and second directions;
a fourth semiconductor region located around each of the separation parts in the first plane, the fourth semiconductor region being of the first conductivity type;
a fifth semiconductor region located on the fourth semiconductor region, the fifth semiconductor region being of the second conductivity type;
a first interconnect electrically connected to at least a portion of the third semiconductor regions;
a first quenching part electrically connected to the first interconnect; and
a second interconnect electrically connected to the fifth semiconductor region at a periphery of the cell region.