US 12,140,626 B2
Test circuit of electronic device, electronic device including test circuit, and operating method thereof
Ki Hyuk Sung, Gyeonggi-do (KR)
Assigned to SK hynix Inc., Gyeonggi-do (KR)
Filed by SK hynix Inc., Gyeonggi-do (KR)
Filed on Nov. 18, 2022, as Appl. No. 17/990,119.
Claims priority of application No. 10-2022-0064314 (KR), filed on May 25, 2022.
Prior Publication US 2023/0384369 A1, Nov. 30, 2023
Int. Cl. G01R 31/316 (2006.01); H03K 17/687 (2006.01)
CPC G01R 31/316 (2013.01) [H03K 17/6871 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An electronic device comprising:
analog circuits;
a control circuit configured to connect, to an output terminal, each of a plurality of nodes respectively included in the analog circuits;
a control signal generator configured to generate a control signal for controlling the control circuit based on an input signal received from an external device; and
a switching circuit disposed on an electrical path for connecting the plurality of nodes and the control circuit to each other and configured to be electrically open during a preset time amount from a time point at which a voltage from an external power source starts to be applied to the control circuit.