US 12,140,610 B2
Test carrier and carrier assembling apparatus
Toshiyuki Kiyokawa, Tokyo (JP); and Kazuya Ohtani, Tokyo (JP)
Assigned to ADVANTEST Corporation, Tokyo (JP)
Filed by ADVANTEST Corporation, Tokyo (JP)
Filed on Sep. 24, 2021, as Appl. No. 17/484,355.
Application 17/484,355 is a continuation of application No. 16/351,348, filed on Mar. 12, 2019, granted, now 11,531,043.
Claims priority of application No. 2018-091984 (JP), filed on May 11, 2018.
Prior Publication US 2022/0011340 A1, Jan. 13, 2022
Int. Cl. G01R 1/04 (2006.01)
CPC G01R 1/0416 (2013.01) [G01R 1/0433 (2013.01)] 1 Claim
OG exemplary drawing
 
1. A test carrier assembling method for assembling a test carrier carried in a state of accommodating a device under test (DUT), the test carrier including a carrier body that holds the DUT and a lid member attached to the carrier body and that covers the DUT, wherein the lid member includes a through-hole through which a suction device sucks the DUT, and the through-hole faces the DUT and penetrates through the lid member, the method comprising:
sucking and holding the carrier body while the carrier body is inverted;
placing the DUT on the lid member while the lid member is inverted;
sucking and holding the DUT through the through-hole by sucking and holding the lid member;
positioning the DUT with respect to the carrier body by moving the carrier body or the lid member;
attaching the lid member to the carrier body by moving the lid member relatively close to the carrier body; and
releasing a suction of the lid member and the DUT after fixing the carrier body and the lid member.