US 12,140,609 B2
Universal test interface systems and methods
Mei-Mei Su, Mountain View, CA (US)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Mar. 31, 2021, as Appl. No. 17/219,400.
Claims priority of provisional application 63/002,699, filed on Mar. 31, 2020.
Prior Publication US 2021/0302469 A1, Sep. 30, 2021
Int. Cl. G01R 1/04 (2006.01)
CPC G01R 1/0416 (2013.01) 20 Claims
OG exemplary drawing
 
1. A testing system comprising:
a loadboard comprising a plurality of universal interfaces with a same coupling configuration;
a plurality of devices under test (DUTs) comprising a plurality of DUT interfaces respectively, wherein a first one of the plurality of DUTs is different than a second one of the plurality of DUTs, wherein the first one of the plurality of DUTs has a first type of DUT interface and the second one of the plurality of DUTs has a second type of DUT interface, wherein the first type of DUT interface has a different coupling configuration compared to the second type of DUT interface; and
a plurality of universal adapters comprising
a plurality of matching universal interfaces that match the plurality of universal interfaces in the loadboard respectively, and
a plurality of matching DUT interfaces, wherein a first one of the plurality of universal adapters comprises a first one of the plurality of matching DUT interfaces that matches the first type of DUT interface and a second one of the plurality of universal adapters comprises a second one of the plurality of matching DUT interfaces that matches the second type of DUT interface, wherein the first one of the plurality of matching DUT interfaces has a different coupling configuration compared to the second one of the plurality of matching DUT interfaces, wherein the plurality of universal adapters are selectively coupled to the loadboard and the plurality of universal adapters are respectively coupled to the plurality of DUTs on an individual basis, wherein one of the plurality of universal adapters has a single interface for coupling with a single one of the plurality of DUTs at a time.