US 12,140,485 B2
Alternating-bias signal resistance detection for resistive temperature detectors in disk drives
John T. Contreras, Palo Alto, CA (US); Joey M. Poss, Rochester, MN (US); Ronald Chang, Fremont, CA (US); and Bernhard E. Knigge, San Jose, CA (US)
Assigned to Western Digital Technologies, Inc., San Jose, CA (US)
Filed by Western Digital Technologies, Inc., San Jose, CA (US)
Filed on Dec. 19, 2023, as Appl. No. 18/545,028.
Application 18/545,028 is a continuation of application No. 17/883,989, filed on Aug. 9, 2022, granted, now 11,874,182.
Claims priority of provisional application 63/357,572, filed on Jun. 30, 2022.
Prior Publication US 2024/0175765 A1, May 30, 2024
Int. Cl. G11B 21/02 (2006.01); G01K 7/24 (2006.01); G11B 5/60 (2006.01)
CPC G01K 7/24 (2013.01) [G11B 5/607 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A data storage device comprising:
a slider with a resistive temperature detector (RTD), the RTD comprising a first resistance electrically connected to a first amplifier circuit; and
one or more processing devices configured to:
generate an alternating-bias signal for biasing the first resistance of the resistive temperature detector (RTD) of the slider, wherein the alternating-bias signal generates a voltage bias across the first resistance;
generate a resistance detection signal; and
process the resistance detection signal to determine a change in a resistance value of the first resistance.