CPC F21K 9/64 (2016.08) [F21Y 2115/10 (2016.08)] | 20 Claims |
1. A method comprising:
obtaining angle and wavelength dependent flux data characterizing a light output radiation intensity pattern through a light output surface of a first light emitting device during operation of the first light emitting device, the first light emitting device comprising a light emitting semiconductor diode structure and a wavelength converting structure;
obtaining angle and wavelength dependent flux data characterizing a light output radiation intensity pattern through a light output surface of a second light emitting device during operation of the second light emitting device, the second light emitting device comprising a light emitting semiconductor diode structure and a wavelength converting structure;
determining or having another determine angle and wavelength dependent transmission properties characterizing an optical filter configured to filter the light output radiation intensity pattern of the second light emitting device to provide a filtered light output radiation intensity pattern characterized by angle and wavelength dependent flux data matching the angle and wavelength dependent flux data characterizing the light output radiation intensity pattern of the first light emitting device; and
manufacturing or having another manufacture an interferometric photonic bandgap filter having the determined angle and wavelength dependent transmission properties.
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