US 12,138,102 B2
Systems and methods for determining examination parameters
Wei Li, Shanghai (CN); and Yongqin Xiao, Shanghai (CN)
Assigned to SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai (CN)
Filed by SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai (CN)
Filed on Nov. 21, 2022, as Appl. No. 18/057,734.
Application 18/057,734 is a continuation of application No. 17/105,643, filed on Nov. 27, 2020, granted, now 11,504,083.
Application 17/105,643 is a continuation of application No. PCT/CN2019/088886, filed on May 28, 2019.
Claims priority of application No. 201810525559.4 (CN), filed on May 28, 2018; and application No. 201811287450.8 (CN), filed on Oct. 31, 2018.
Prior Publication US 2023/0083704 A1, Mar. 16, 2023
Int. Cl. A61B 6/00 (2024.01); A61B 6/04 (2006.01); A61B 6/46 (2024.01)
CPC A61B 6/544 (2013.01) [A61B 6/04 (2013.01); A61B 6/463 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A method for determining one or more target examination parameters, implemented on a computing device having at least one processor and at least one non-transitory storage medium, the method comprising:
obtaining target examination information of a subject;
generating one or more initial examination parameters based on the target examination information;
obtaining one or more first historical examination records associated with the subject;
determining whether the one or more first historical examination records include one or more second historical examination records matching the target examination information;
in response to a determination that the one or more first historical examination records include one or more second historical examination records matching the target examination information, obtaining one or more historical examination parameters from the one or more second historical examination records; and
updating at least one of the one or more initial examination parameters based on the one or more historical examination parameters to obtain one or more target examination parameters, wherein the one or more target examination parameters are used for performing a target examination on the subject.