US 12,138,100 B1
Method for operating an x-ray imaging system, method for generating a database, control system, x-ray imaging system, control facility, computer program and electronically readable data storge medium
Richard Obler, Erlangen (DE); and Philipp Bernhardt, Forchheim (DE)
Assigned to Siemens Healthineers AG, Forchheim (DE)
Filed by Siemens Healthineers AG, Forchheim (DE)
Filed on May 10, 2024, as Appl. No. 18/661,118.
Claims priority of application No. 10 2023 204 333.5 (DE), filed on May 10, 2023.
Int. Cl. G06T 7/80 (2017.01); A61B 6/00 (2006.01)
CPC A61B 6/54 (2013.01) [A61B 6/481 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A method for operating an X-ray imaging system, the method comprising:
outputting first X-ray beams onto an X-ray detector by an X-ray source for acquisition of a first X-ray capture of an object under examination, wherein the object under examination is arranged between the X-ray source and the X-ray detector and is passed through by the first X-ray beams;
acquiring, by the X-ray detector, an entry dose of the first X-ray beams after passage through the object under examination;
ascertaining, by a control system of the X-ray imaging system, a parameter value of at least one parameter for output of second X-ray beams by the X-ray source for acquisition of a second X-ray capture of the object under examination,
wherein the parameter value is ascertained by the control system according to a specified ascertainment method as a function of a foreground substance of a foreground object arranged in the object under examination, a background substance of a background object arranged in the object under examination, and the entry dose, and
wherein the ascertainment method parameterizes the parameter value of the at least one parameter, such that an expected contrast-to-noise ratio between a first signal intensity value in the second X-ray capture of a first X-ray beam course of the second X-ray beams that has passed through the background object in the object under examination, and a second signal intensity value in the second X-ray capture of a second X-ray beam course that has passed through the background object and the foreground object is maximized.