| CPC H01L 23/5385 (2013.01) [H01L 21/4853 (2013.01); H01L 21/4857 (2013.01); H01L 21/486 (2013.01); H01L 21/561 (2013.01); H01L 21/565 (2013.01); H01L 21/568 (2013.01); H01L 23/3135 (2013.01); H01L 23/49816 (2013.01); H01L 23/49822 (2013.01); H01L 23/49833 (2013.01); H01L 23/49838 (2013.01); H01L 23/5386 (2013.01); H01L 23/552 (2013.01); H01L 24/16 (2013.01); H01L 24/32 (2013.01); H01L 24/73 (2013.01); H01L 24/96 (2013.01); H01L 24/97 (2013.01); H01L 25/162 (2013.01); H01L 25/165 (2013.01); H01L 21/563 (2013.01); H01L 24/81 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/16238 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/32245 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/81203 (2013.01); H01L 2224/95001 (2013.01); H01L 2924/182 (2013.01); H01L 2924/3511 (2013.01); H01L 2924/3512 (2013.01); H01L 2924/37001 (2013.01)] | 21 Claims |

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12. A semiconductor device, comprising:
a first redistribution layer (RDL) substrate;
a plurality of first conductive pillars formed over a first surface of the first RDL substrate;
a first electrical component disposed over the first surface of the first RDL substrate;
a hybrid substrate bonded to the first RDL substrate;
an encapsulant deposited around the hybrid substrate and first RDL substrate with the first conductive pillars and first electrical component embedded within the encapsulant; and
a first RDL formed over a second surface of the first RDL substrate opposite the first surface of the first RDL substrate.
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