US 12,469,544 B2
Sense amplifier circuitry and threshold voltage compensation
Wenlun Zhang, Chofu (JP); Hiroki Fujisawa, Sagamihara (JP); Shinichi Miyatake, Sagamihara (JP); and Yuan He, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Nov. 10, 2023, as Appl. No. 18/506,202.
Claims priority of provisional application 63/487,448, filed on Feb. 28, 2023.
Prior Publication US 2024/0290376 A1, Aug. 29, 2024
Int. Cl. G11C 11/00 (2006.01); G11C 5/14 (2006.01); G11C 11/4091 (2006.01); G11C 11/4096 (2006.01)
CPC G11C 11/4091 (2013.01) [G11C 5/147 (2013.01); G11C 11/4096 (2013.01)] 20 Claims
OG exemplary drawing
 
9. A sense amplifier, comprising:
a first transistor coupled between a first node configured to receive an activation signal, a first digit line, and a second digit line, wherein the first digit line is configured to receive a first charge from one or more memory cells corresponding to the sense amplifier for sensing, the second digit line is configured to receive a second charge from the one or more memory cells and is complementary to the first digit line;
a second transistor coupled between the first node, the first digit line, and a second digit line;
a third transistor coupled between a first gut node corresponding to the first digit line, a second gut node corresponding to the second digit line, and a second node configured to receive a strobe signal;
a fourth transistor coupled between the first gut node, the second gut node, and the second node; and
threshold voltage compensation circuitry configured to:
compensate for a threshold voltage offset between the third and fourth transistors during a voltage threshold compensation phase without using any threshold voltage offset between the first and second transistors;
pre-sense using the third and fourth transistors during a pre-sense phase; and
sense and latch using the first, second, third, and fourth transistors during a main sensing and latching phase after the pre-sense phase.