US 12,468,782 B2
Force sensor sample classification
Josh Sanz-Robinson, Austin, TX (US); Siddharth Maru, Austin, TX (US); Rahul Gawde, Lakeway, TX (US); Jon D. Hendrix, Wimberley, TX (US); Eric Lindemann, Boulder, CO (US); and Pablo Peso Parada, London (GB)
Assigned to Cirrus Logic Inc., Austin, TX (US)
Filed by Cirrus Logic International Semiconductor Ltd., Edinburgh (GB)
Filed on Mar. 25, 2021, as Appl. No. 17/212,880.
Application 17/212,880 is a continuation in part of application No. 17/128,859, filed on Dec. 21, 2020, abandoned.
Prior Publication US 2022/0198227 A1, Jun. 23, 2022
Int. Cl. G06F 18/24 (2023.01); G01L 1/14 (2006.01); G06F 18/25 (2023.01); H03K 17/96 (2006.01)
CPC G06F 18/24 (2023.01) [G01L 1/14 (2013.01); G06F 18/254 (2023.01); H03K 17/96 (2013.01); H03K 2217/96038 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A classification system for classifying sensor samples in a sensor system, the sensor system comprising N force sensors each configured to output a sensor signal, where N≥1, each sensor sample comprising N sample values from the N sensor signals, respectively, the classification system comprising:
a classifier configured, for each of a series of candidate sensor samples, to perform a classification operation based on the N sample values concerned and generate a classification result which labels the candidate sensor sample as indicative of a defined target event, thereby generating a series of classification results corresponding to the series of candidate sensor samples, respectively;
a determiner configured to output at least one event determination based on the series of classification results; and
a controller configured to control the classifier and/or the determiner based on one or more controller input signals;
wherein:
the classifier is configured for operation at at least one configuration value of a reference signal, the reference signal comprising or derived from at least one controller input signal;
the controller is configured, based on a current value of the reference signal, to control the classifier and/or the determiner to reduce a difference, being a configuration-related difference, between:
the classification results and/or the at least one event determination; and
corresponding classification results and/or a corresponding at least one event determination expected when the reference signal has the configuration value in respect of which the classifier is operating;
said sensor samples are untransformed sensor samples;
the classifier comprises a sensor sample transformer configured to generate transformed sensor samples by transforming the untransformed sensor samples;
the classifier is configured, for each of the series of candidate sensor samples, to perform the classification operation based on the corresponding transformed sensor sample;
the controller is configured to control the sensor sample transformer based on the reference signal to reduce the configuration-related difference; and
the sensor sample transformer is configured to transform the untransformed sensor samples into the transformed sensor samples based on a sensor-sample transform function and the reference signal, the sensor-sample transform function being a function of the reference signal.