US 12,467,972 B2
Scan test in a single-wire bus circuit
Alexander Wayne Hietala, Phoenix, AZ (US); Christopher Truong Ngo, Queen Creek, AZ (US); and Ryan Lee Bunch, Greensboro, NC (US)
Assigned to Qorvo US, Inc., Greensboro, NC (US)
Filed by Qorvo US, Inc., Greensboro, NC (US)
Filed on Jun. 27, 2024, as Appl. No. 18/755,800.
Application 18/755,800 is a continuation of application No. 17/545,113, filed on Dec. 8, 2021.
Prior Publication US 2024/0345162 A1, Oct. 17, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 31/3177 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G01R 31/3187 (2006.01); G11C 29/32 (2006.01); G11C 29/56 (2006.01)
CPC G01R 31/3177 (2013.01) [G01R 31/2851 (2013.01); G01R 31/2884 (2013.01); G01R 31/31712 (2013.01); G01R 31/31713 (2013.01); G01R 31/31724 (2013.01); G01R 31/318572 (2013.01); G01R 31/3187 (2013.01); G11C 29/32 (2013.01); G11C 2029/5602 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for testing a communication circuit in a single-wire bus circuit comprising:
coupling a bus pin to a master circuit via a single-wire bus;
coupling the communication circuit to the bus pin in a communication mode to carry out normal communications over the single-wire bus;
receiving a test initiation command from the master circuit during the communication mode that instructs the communication circuit to switch to a test mode to undergo a test; and
decoupling the communication circuit from the bus pin and coupling a driver circuit to the bus pin to thereby perform the test in the communication circuit in response to receiving the test initiation command.