US 12,467,970 B2
Test arrangement for testing one or more devices, test support module for supporting testing one or more devices, and method for operating an automated test equipment
Matthias Werner, Bibertal (DE)
Assigned to ADVANTEST CORPORATION, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Jan. 31, 2023, as Appl. No. 18/162,699.
Application 18/162,699 is a continuation of application No. PCT/EP2020/083806, filed on Nov. 27, 2020.
Prior Publication US 2023/0184824 A1, Jun. 15, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/27 (2006.01)
CPC G01R 31/2834 (2013.01) [G01R 1/07342 (2013.01)] 27 Claims
OG exemplary drawing
 
1. A test support module comprising:
a plurality of pogo pins configured to establish a connection to at least one of a load board or a probe card of an automated test equipment;
at least one electronic support component configured to support a test of at least one device under test (DUT),
at least one of a multiplexer, a signal distributor, a signal conditioner, or a signal protocol converter;
a signal path input, and
a signal path output,
wherein the at least one of the multiplexer, the signal distributor, the signal conditioner, or the signal protocol converter is in a signal path between the signal path input and the signal path output,
wherein the at least one electronic support component is electrically coupled to the pogo pins;
wherein the test support module is configured to be inserted into a pogo block frame of the automated test equipment to position the pogo pins in an alignment position to contact at least one of the load board or the probe card.