US 12,467,969 B2
Automated test equipment and method using device specific data
Matthias Sauer, Böblingen (DE); Olaf Pöppe, Tübingen (DE); and Klaus-Dieter Hilliges, Stuttgart (DE)
Assigned to ADVANTEST CORPORATION, Tokyo (JP)
Filed by ADVANTEST CORPORATION, Tokyo (JP)
Filed on Dec. 2, 2022, as Appl. No. 18/074,325.
Application 18/074,325 is a continuation of application No. PCT/EP2020/070600, filed on Jul. 21, 2020.
Prior Publication US 2023/0100093 A1, Mar. 30, 2023
Int. Cl. G01R 31/28 (2006.01); G01R 13/02 (2006.01); G01R 31/319 (2006.01); H04L 43/50 (2022.01)
CPC G01R 31/2834 (2013.01) [G01R 13/02 (2013.01); G01R 31/287 (2013.01); G01R 31/31905 (2013.01); H04L 43/50 (2013.01)] 23 Claims
OG exemplary drawing
 
1. An automated test equipment for testing a plurality of devices under test (DUTs), the automated test equipment comprising:
a tester control, coupled to a plurality of channel processing units, wherein the tester control is configured to output DUT-agnostic input data and DUT-specific data to the plurality of channel processing units, and wherein a data volume of the DUT-specific data is less than the DUT-agnostic input data; and
the plurality of channel processing units each configured for testing a respective set of the plurality of DUTs, to the plurality of channel processing units including:
a first channel processing unit coupled to a first DUT by a first set of one or more communication channels and a second DUT by a second set of one or more communication channels;
the first channel processing unit configured to receive the DUT-agnostic input data and receive the DUT-specific data specific to the first DUT and the DUT-specific data specific to the second DUT, from the tester control;
the first channel processing unit configured to transform the DUT-agnostic input data using the DUT-specific data specific to the first DUT to obtain DUT-adapted data specific to the first DUT and to transform the DUT-agnostic input data using the DUT-specific data specific to the second DUT to obtain DUT-adapted data specific to the second DUT;
the first channel processing unit further configured to output the DUT-adapted data specific to the first DUT across the first set of one or more communication channels to the first DUT and to output the DUT-adapted data specific to the second DUT across the second set of one or more communication channels to the second DUT;
the first channel processing unit further configured to receive DUT-test data specific to the first DUT across the first set of one or more communication channels from the first DUT and to receive DUT-test data specific to the second DUT across the second set of one or more communication channels from the second DUT;
the first channel process unit further configured to process the DUT-test data specific to the first DUT using the DUT-specific data specific to the first DUT and to process the DUT-test data specific to the second DUT using the DUT-specific data specific to the second DUT;
a second channel processing unit coupled to a third DUT by a third set of one or more communication channels and a fourth DUT by a fourth set of one or more communication channels;
the second channel processing unit configured to receive the DUT-agnostic input data and receive the DUT-specific data specific to the third DUT and the DUT-specific data specific to the fourth DUT, from the tester control;
the second channel processing unit configured to transform the DUT-agnostic input data using the DUT-specific data specific to the third DUT to obtain DUT-adapted data specific to the third DUT and to transform the DUT-agnostic input data using the DUT-specific data specific to the fourth DUT to obtain DUT-adapted data specific to the fourth DUT;
the second channel processing unit further configured to output the DUT-adapted data specific to the third DUT across the third set of one or more communication channels to the third DUT and to output the DUT-adapted data specific to the fourth DUT across the fourth set of one or more communication channels to the second DUT;
the second channel processing unit further configured to receive DUT-test data specific to the third DUT across the third set of one or more communication channels from the third DUT and to receive DUT-test data specific to the fourth DUT across the fourth set of one or more communication channels from the second DUT;
the second channel process unit further configured to process the DUT-test data specific to the third DUT using the DUT-specific data specific to the third DUT and to process the DUT-test data specific to the fourth DUT using the DUT-specific data specific to the fourth DUT.