US 12,467,948 B2
Contact probe
Ichikawa Hiroyuki, Kawaguchi (JP)
Assigned to Enplas Corporation, Kawaguchi (JP)
Filed by Enplas Corporation, Kawaguchi (JP)
Filed on Nov. 22, 2023, as Appl. No. 18/517,424.
Claims priority of application No. 202211503557.8 (CN), filed on Nov. 28, 2022.
Prior Publication US 2024/0175899 A1, May 30, 2024
Int. Cl. G01R 31/20 (2006.01); G01R 1/067 (2006.01)
CPC G01R 1/06744 (2013.01) [G01R 1/06716 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A contact probe comprising:
a tubular structure (100), within which an elastic member (200) is received;
an engagement part (110) arranged within the tubular structure (100);
a pushing part (120) arranged within the tubular structure (100) and arranged at an inner wall of the tubular structure (100) opposite to the engagement part (110);
the elastic member (200), a part of the elastic member (200) is arranged within the tubular structure (100), a side surface at a first end of the elastic member (200) is engaged with the engagement part (110), and the pushing part (120) presses a side surface of the elastic member facing the pushing part, and both the engagement part (110) and the pushing part (120) press the elastic member (200) to make the elastic member (200) in a bent state, and make the part of the elastic member (200) within the tubular structure (100) to abut closely against the inner wall of the tubular structure (100).