US 12,467,912 B2
Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis device
Takahito Inoue, Kyoto (JP); and Hiroshi Uchihara, Kyoto (JP)
Assigned to HORIBA, LTD., Kyoto (JP)
Appl. No. 17/999,784
Filed by HORIBA, LTD., Kyoto (JP)
PCT Filed Oct. 8, 2021, PCT No. PCT/JP2021/037293
§ 371(c)(1), (2) Date Nov. 23, 2022,
PCT Pub. No. WO2022/091748, PCT Pub. Date May 5, 2022.
Claims priority of application No. 2020-183839 (JP), filed on Nov. 2, 2020.
Prior Publication US 2023/0221291 A1, Jul. 13, 2023
Int. Cl. B01L 3/00 (2006.01); B01D 15/08 (2006.01); B01F 33/302 (2022.01); B01F 33/3033 (2022.01); B01J 20/285 (2006.01); B01J 20/287 (2006.01); B01J 20/32 (2006.01); B01L 7/00 (2006.01); B01L 9/00 (2006.01); B65G 47/80 (2006.01); B82Y 20/00 (2011.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C12M 1/34 (2006.01); C12M 3/06 (2006.01); C12N 1/14 (2006.01); C12N 1/20 (2006.01); C12Q 1/02 (2006.01); C12Q 1/6806 (2018.01); C12Q 1/6844 (2018.01); C12Q 1/6848 (2018.01); C12Q 1/686 (2018.01); G01N 1/44 (2006.01); G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/1433 (2024.01); G01N 21/29 (2006.01); G01N 21/33 (2006.01); G01N 21/65 (2006.01); G01N 30/02 (2006.01); G01N 30/60 (2006.01); G01N 30/72 (2006.01); G01N 31/12 (2006.01); G01N 33/543 (2006.01); G01N 33/557 (2006.01); G01N 33/574 (2006.01); G01N 33/58 (2006.01); G01N 33/68 (2006.01); G01N 35/00 (2006.01); H05B 45/10 (2020.01)
CPC G01N 31/12 (2013.01) [G01N 1/44 (2013.01)] 12 Claims
OG exemplary drawing
 
1. An element analysis method including heating a sample placed in a crucible in a heating furnace; and measuring an amount of an element contained in a gas discharged from the heating furnace by an analysis mechanism to analyze the element contained in the sample, the method comprising:
a blank measurement step of measuring the amount of the element contained in the gas discharged from the heating furnace when only the crucible is heated, and
a zero-point correction amount setting step of setting an amount of zero-point correction based on a measurement value in a transient state region where the measurement value rises in blank data obtained in the blank measurement step.