US 12,467,875 B2
Multi-sensor test device for quality control scanning
Theodore G. Doros, Fairfax, VA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Aug. 31, 2022, as Appl. No. 17/823,806.
Prior Publication US 2024/0068952 A1, Feb. 29, 2024
Int. Cl. G01N 21/88 (2006.01); G06T 7/00 (2017.01)
CPC G01N 21/8851 (2013.01) [G06T 7/0004 (2013.01); G01N 2021/8864 (2013.01); G01N 2021/888 (2013.01); G05B 2219/32179 (2013.01); G05B 2219/32193 (2013.01)] 25 Claims
OG exemplary drawing
 
1. A test device, comprising:
an enclosure;
a set of sensors disposed within the enclosure;
a set of openings in the enclosure aligned to the set of sensors; and
a controller coupled to the set of sensors configured to:
initiate a set of measurements including at least one imaging measurement and at least one non-imaging measurement, by the set of sensors, of an object using the set of sensors;
obtain the set of measurements of the object from the sensors based on initiating the set of measurements;
analyze the set of measurements of the object, using a computer vision model, to identify whether one or more defects are present with the object;
apply an artificial intelligence model of object failure to the at least one imaging measurement and the at least one non-imaging measurement to determine whether a failure threshold is satisfied for the object based on determining whether the one or more defects are present with the object; and
provide, based on whether the failure threshold is satisfied for the object:
first output,
the first output indicating that the failure threshold is not satisfied for the object, and
the first output including a classification of at least one defect present with the object determined based at least in part on a defect classification model, or
second output,
the second output identifying a classification of a failure of the object based on the failure threshold being satisfied for the object.