US 12,467,872 B2
Method and device for detecting local defects on a reflective surface
Klaus Veit, Fürth (DE)
Assigned to ISRA VISION GmbH, Darmstadt (DE)
Appl. No. 18/577,922
Filed by ISRA VISION GMBH, Darmstadt (DE)
PCT Filed Sep. 9, 2022, PCT No. PCT/EP2022/075123
§ 371(c)(1), (2) Date Jan. 9, 2024,
PCT Pub. No. WO2023/041436, PCT Pub. Date Mar. 23, 2023.
Claims priority of application No. 102021123880.3 (DE), filed on Sep. 15, 2021.
Prior Publication US 2024/0319105 A1, Sep. 26, 2024
Int. Cl. G01N 21/88 (2006.01); G01N 21/958 (2006.01)
CPC G01N 21/8806 (2013.01) [G01N 21/958 (2013.01); G01N 2021/8829 (2013.01); G01N 2021/9586 (2013.01); G01N 2201/126 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A method for detecting local defects on a reflective surface with a device comprising at least one pattern for reflection on the reflective surface, at least one camera and a data processing unit, wherein the at least one pattern comprises at least one line-shaped light-dark transition, and wherein a position and orientation of the at least one camera being known, wherein the method comprises:
recording, by the at least one camera, a reflected pattern on the reflective surface and generating image data of the reflected pattern;
transmitting the image data from the at least one camera to the data processing unit; and,
determining, by the at least one data processing unit, one or more local defects on the reflective surface based on an evaluation of at least one property of the at least one line-shaped light-dark transition in the image data of the reflected pattern,
wherein the at least one property of the at least one line-shaped light-dark transition in the image data comprises a contrast in a predetermined area of the at least one line-shaped light-dark transition in the image data.