CPC H10B 41/35 (2023.02) [H01L 21/0273 (2013.01); H01L 21/31144 (2013.01); H01L 21/76805 (2013.01); H01L 21/76816 (2013.01); H01L 21/76895 (2013.01); H01L 23/5283 (2013.01); H01L 23/53209 (2013.01); H01L 23/53242 (2013.01); H01L 23/53257 (2013.01); H01L 23/535 (2013.01); H10B 41/41 (2023.02); H10B 43/27 (2023.02); H10B 43/35 (2023.02); H10B 43/50 (2023.02)] | 20 Claims |
1. A semiconductor structure, comprising:
a first material layer and a second material layer, wherein the first material layer is disposed over a first portion of the second material layer;
a first landing pad disposed over a second portion of the second material layer, wherein the first landing pad comprises a first side surface and a second side surface, and wherein the first side surface is in contact with the first material layer and the second side surface is laterally displaced from a side surface of the second portion of the second material layer;
another first material layer and another second material layer, wherein the another first material layer is disposed over a first portion of the another second material layer, and wherein the second material layer is disposed over the another first material layer; and
a second landing pad disposed over a second portion of the another second material layer, wherein the second landing pad comprises a third side surface and a fourth side surface, wherein the third side surface is in contact with the another first material layer and the fourth side surface is laterally displaced from a side surface of the second portion of the another second material layer, and wherein the second side surface of the first landing pad is laterally displaced from the third side surface of the second landing pad.
|