US 12,136,900 B2
Method, apparatus, and system for detecting solar cell of photovoltaic plant
Jianqiang Wang, Shanghai (CN); Song Wan, Shanghai (CN); Yanzhong Zhang, Shanghai (CN); and Yongbing Gao, Shanghai (CN)
Assigned to Huawei Digital Power Technologies Co., Ltd., Shenzhen (CN)
Filed by Huawei Digital Power Technologies Co., Ltd., Shenzhen (CN)
Filed on Feb. 11, 2022, as Appl. No. 17/669,724.
Application 17/669,724 is a continuation of application No. PCT/CN2020/093606, filed on May 30, 2020.
Claims priority of application No. 201910741156.8 (CN), filed on Aug. 12, 2019.
Prior Publication US 2022/0166377 A1, May 26, 2022
Int. Cl. H02S 50/15 (2014.01); H02S 40/32 (2014.01); H04N 5/33 (2023.01)
CPC H02S 50/15 (2014.12) [H02S 40/32 (2014.12); H04N 5/33 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A method for detecting a solar cell of a photovoltaic plant, the method comprising:
obtaining a first infrared image and a second infrared image, wherein the first infrared image comprises infrared image information corresponding to an ambient infrared signal reflected by a to-be-detected solar cell operating in a short-circuit state, the second infrared image comprises infrared image information corresponding to an infrared signal emitted by the to-be-detected solar cell operating in a first state and infrared image information corresponding to an ambient infrared signal reflected by the to-be-detected solar cell, and the first state is another state other than the short-circuit state;
obtaining a third infrared image by subtracting brightness information of pixels in the first infrared image from brightness information of pixels in the second infrared image;
comparing the third infrared image with sample images stored in a defect library, wherein each sample image corresponds to a respective defect; and
detecting a defect after the comparison results in a similarity of the third infrared image to a sample image with a particular defect that exceeds a preset similarity threshold.