CPC H01L 31/02327 (2013.01) [G02B 6/12004 (2013.01); G02B 6/124 (2013.01); G02B 6/131 (2013.01); G02B 6/136 (2013.01); H01L 31/028 (2013.01); H01L 31/1808 (2013.01); G02B 2006/12061 (2013.01); G02B 2006/12107 (2013.01)] | 20 Claims |
1. A semiconductor device, comprising:
a first doped region having a first doping type disposed in a semiconductor substrate;
a second doped region having a second doping type different than the first doping type disposed in the semiconductor substrate, wherein the first doped region and the second doped region are laterally spaced;
a waveguide structure disposed in the semiconductor substrate and laterally between the first doped region and the second doped region; and
a photodetector disposed at least partially in the semiconductor substrate and laterally between the first doped region and the second doped region, wherein:
the waveguide structure is configured to guide one or more photons into the photodetector;
the photodetector has an upper surface that continuously arcs between opposite sidewalls of the photodetector; and
the photodetector has a lower surface that continuously arcs between the opposite sidewalls, wherein the continuous arc of the lower surface reduces a dark current within the photodetector.
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