CPC H01L 25/105 (2013.01) [H01L 25/18 (2013.01); H01L 25/50 (2013.01); H01L 2225/1035 (2013.01); H01L 2225/1041 (2013.01); H01L 2225/1058 (2013.01); H01L 2225/1094 (2013.01)] | 20 Claims |
1. A method comprising:
bonding a plurality of device dies to an interposer wafer;
encapsulating the plurality of device dies in a first encapsulant;
polishing the interposer wafer to reveal through-vias in a substrate of the interposer wafer;
forming electrical connectors connecting to the through-vias;
singulating the interposer wafer and the first encapsulant to form a first building block;
encapsulating the first building block in a second encapsulant;
forming a fan-out interconnect structure over and contacting the second encapsulant; and
attaching a power module over the fan-out interconnect structure.
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