US 12,136,467 B2
Tracking the effects of voltage and temperature on a memory device using an internal oscillator
Keun soo Song, Eagle, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Jun. 2, 2022, as Appl. No. 17/831,114.
Prior Publication US 2023/0395098 A1, Dec. 7, 2023
Int. Cl. G11C 7/04 (2006.01); G11C 7/10 (2006.01); H03K 19/21 (2006.01); H03L 7/099 (2006.01)
CPC G11C 7/04 (2013.01) [G11C 7/1069 (2013.01); G11C 7/1096 (2013.01); H03K 19/21 (2013.01); H03L 7/0995 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled with the memory device, to perform operations comprising:
receiving a first oscillator count value at a first time and a second oscillator count value at a second time, wherein the first time precedes the second time;
comparing the first oscillator count value to the second oscillator count value; and
responsive to determining that a difference between the first oscillator count value and the second oscillator count value satisfies a criterion, adjusting a propagation delay for performing write operations on the memory device.