US 12,136,283 B2
Systems, devices and methods for identifying, collecting, relocating, and analyzing micrometer- and nanometer-scale particles
Kristin R. Di Bona, Laramie, WY (US); and Caleb M. Hill, Laramie, WY (US)
Assigned to WYONICS LLC, Laramie, WY (US)
Appl. No. 18/559,769
Filed by WYONICS LLC, Laramie, WY (US)
PCT Filed Apr. 11, 2023, PCT No. PCT/US2023/018167
§ 371(c)(1), (2) Date Nov. 8, 2023,
PCT Pub. No. WO2023/200787, PCT Pub. Date Oct. 19, 2023.
Claims priority of provisional application 63/330,168, filed on Apr. 12, 2022.
Prior Publication US 2024/0233413 A1, Jul. 11, 2024
Int. Cl. G06V 20/69 (2022.01); G01N 15/1433 (2024.01); G06T 7/70 (2017.01)
CPC G06V 20/693 (2022.01) [G01N 15/1433 (2024.01); G06T 7/70 (2017.01); G06T 2207/10056 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A particle manipulation system, comprising:
an optical imaging system configured to acquire an image of a sample of particles;
a processor configured to analyze the image, the image analysis comprising at least identifying a target particle in the image and determining or recording the lateral position of the target particle in the sample of particles; and
a vacuum-based probe system comprising:
a moveable probe comprising a hollow needle having an opening at a distal end thereof, the opening having a first diameter that is smaller than the size of the target particle; and
a vacuum pump configured to apply a vacuum up through the probe;
wherein the processor is further configured to instruct the vacuum-based probe system to:
move the moveable probe to the lateral position of the target particle; and
apply a vacuum up through the probe such that the target particle is pulled away from the sample of particles and held against the tip of the moveable probe.