CPC G06F 21/602 (2013.01) [G06F 7/588 (2013.01)] | 20 Claims |
1. A method for operating an integrated circuit, the method comprising:
generating a random value by a random number generator circuit; and
storing the random value in a memory area of a non-volatile fuse-type memory by a finite state machine, the finite state machine coupled to the random number generator circuit via a first dedicated bus, the memory area being only accessible by the finite state machine,
wherein at each reset phase of the integrated circuit, a content of the memory area is loaded by the finite state machine into a volatile memory,
wherein a transition of the integrated circuit in and out of a state, allowing execution of a scan test, generates deleting of content stored in the volatile memory, and
wherein the non-volatile fuse-type memory is disconnected from the integrated circuit in response to the integrated circuit being in the state allowing execution of the scan test.
|