CPC G02B 6/385 (2013.01) [G02B 6/3879 (2013.01); G02B 21/0016 (2013.01); G02B 21/0032 (2013.01); G02B 21/361 (2013.01)] | 9 Claims |
1. An inspection apparatus for inspecting a first end-face and a second end face of a duplex fiber optic connector installed into a duplex adapter of a cassette without decoupling the duplex fiber optic connector from the duplex adapter, the inspection apparatus comprising:
a first microscope probe comprising:
a first light source configured to emit a first light;
a first beam splitter configured to receive the first light and direct at least a portion of the first light to a first fixed lens system towards the first end-face and direct at least a portion of the first light to a first variable focus lens system towards a first image sensor;
the first fixed lens system configured to receive the portion of the first light and direct it towards the first end-face;
the first variable focus lens system configured to receive the portion of the first light and direct it towards the first image sensor; and
the first image sensor configured to receive the portion of the first light and capture an image of the first end-face;
a second microscope probe comprising:
a second light source configured to emit a second light;
a second beam splitter configured to receive the second light and direct at least a portion of the second light to a second fixed lens system towards the second end-face and direct at least a portion of the second light to a variable focus lens system towards a second image sensor;
the second fixed lens system configured to receive the portion of the second light and direct it towards the second end-face;
the second variable focus lens system configured to receive the portion of the second light and direct it towards the second image sensor; and
the second image sensor configured to receive the portion of the second light and capture an image of the second end-face; and
a first securing portion configured to directly secure to a second securing portion of a secondary inspection apparatus to form an array including at least the inspection apparatus and the secondary inspection apparatus, wherein the secondary inspection apparatus includes a first secondary microscope probe and a second secondary microscope probe for inspecting a first end-face and a second end face of a secondary duplex fiber optic connector installed into a secondary duplex adapter of the cassette without decoupling the secondary duplex fiber optic connector from the secondary duplex adapter.
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