US 12,135,353 B2
Indirect acquisition of a signal from a device under test
Sam J. Strickling, Portland, OR (US); and David Everett Burgess, Beaverton, OR (US)
Assigned to Tektronix, Inc.
Filed by Tektronix, Inc., Beaverton, OR (US)
Filed on Nov. 13, 2020, as Appl. No. 17/098,155.
Claims priority of provisional application 63/050,053, filed on Jul. 9, 2020.
Claims priority of provisional application 62/936,305, filed on Nov. 15, 2019.
Prior Publication US 2021/0148975 A1, May 20, 2021
Int. Cl. G01R 31/3177 (2006.01); G01R 31/28 (2006.01); G05B 19/042 (2006.01); G06F 30/32 (2020.01); G06F 3/0484 (2022.01)
CPC G01R 31/3177 (2013.01) [G01R 31/2886 (2013.01); G05B 19/042 (2013.01); G06F 30/32 (2020.01); G05B 2219/50391 (2013.01); G06F 3/0484 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A system for probing a device under test (DUT), the system comprising:
a test-and-measurement probe;
a user interface displaying a digital representation of the DUT, the digital representation including virtual nodes that correspond to actual nodes of a physical circuit on the DUT;
a robot configured to position the test-and-measurement probe with respect to the DUT;
a controller configured to receive an indication of a user-selected virtual nodefrom the user interface, and to provide instructions to the robot to position the test-and-measurement probe to an actual node on the DUT corresponding to the user-selected virtual node; and
a vision system configured to scan the topology of the physical circuit on the DUT and to communicate with the controller to correlate the user-selected virtual node to the actual node on the DUT and to map key topologies of the physical circuit on the DUT to enable referencing and probing without the need for rigid bounds,
wherein the vision system uses one or more of 3D visible light imaging, multispectral imaging, hyperspectral imaging, infrared light imaging, line scan imaging, X-ray imaging, and other radiographic imaging.