US 12,135,352 B2
Random number generation testing systems and methods
Marilyn Kushnick, San Jose, CA (US); and Duane Champoux, San Jose, CA (US)
Assigned to Advantest Corporation, Tokyo (JP)
Filed by Advantest Corporation, Tokyo (JP)
Filed on Mar. 31, 2021, as Appl. No. 17/219,521.
Claims priority of provisional application 63/002,854, filed on Mar. 31, 2020.
Prior Publication US 2021/0302496 A1, Sep. 30, 2021
Int. Cl. G01R 31/317 (2006.01); G06F 7/58 (2006.01)
CPC G01R 31/31707 (2013.01) [G01R 31/31722 (2013.01); G01R 31/31724 (2013.01); G06F 7/582 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
accessing a plurality of data values to write to a device under test (DUT);
generating a plurality of addresses pseudo randomly and assigning one of the plurality of addresses to a respective one of the plurality of data values, wherein assignments of the one of the plurality of addresses to different respective ones of the plurality of data values are randomly repeatable within a block before assignment of each of the plurality of addresses in a block; and
directing writing of the plurality of data values to the DUT in accordance with the plurality of addresses that are pseudo randomly generated and randomly repeated.