US 12,135,350 B2
Electronic component testing system and time certification method
Tzu-Ching Yang, Taoyuan (TW); and Shih-Chao Lin, Taoyuan (TW)
Assigned to Chroma ATE Inc., Taoyuan (TW)
Filed by Tzu-Ching Yang, Taoyuan (TW); and Shih-Chao Lin, Taoyuan (TW)
Filed on May 9, 2021, as Appl. No. 17/315,313.
Claims priority of application No. 109115511 (TW), filed on May 11, 2020.
Prior Publication US 2021/0349146 A1, Nov. 11, 2021
Int. Cl. G01R 31/28 (2006.01); G01R 31/317 (2006.01)
CPC G01R 31/2889 (2013.01) [G01R 31/2849 (2013.01); G01R 31/31719 (2013.01); G01R 31/31726 (2013.01)] 15 Claims
OG exemplary drawing
 
1. An electronic component testing system, comprising:
a testing device comprising a backboard, electrically connected to at least one test board and comprising a time certification component; and
an interface device, electrically connected to the testing device, providing a test instruction;
wherein the time certification component stores an authorization start time and an authorization end time;
wherein the testing device starts a test procedure according to the test instruction, the time certification component updates the authorization start time to a first stop time of the test procedure after the test procedure is completed.