US 12,135,273 B2
Method for characterising a particle on the basis of a hologram
Pierre Blandin, Grenoble (FR); Cédric Allier, Grenoble (FR); Olivier Cioni, Grenoble (FR); Lionel Herve, Grenoble (FR); Pierre Joly, Grenoble (FR); and Jean-Marc Dinten, Grenoble (FR)
Assigned to COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris (FR); HORIBA ABX SAS, Montpellier (FR); and IPRASENSE SAS, Clapiers (FR)
Appl. No. 17/414,801
Filed by COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Paris (FR); HORIBA ABX SAS, Montpellier (FR); and IPRASENSE SAS, Clapiers (FR)
PCT Filed Dec. 16, 2019, PCT No. PCT/FR2019/053096
§ 371(c)(1), (2) Date Jun. 16, 2021,
PCT Pub. No. WO2020/128282, PCT Pub. Date Jun. 25, 2020.
Claims priority of application No. 18 73260 (FR), filed on Dec. 18, 2018.
Prior Publication US 2022/0018756 A1, Jan. 20, 2022
Int. Cl. G01N 15/1434 (2024.01); G03H 1/08 (2006.01)
CPC G01N 15/1434 (2013.01) [G03H 1/0866 (2013.01); G01N 2015/1445 (2013.01); G01N 2015/145 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A method for characterizing a particle within a sample, the sample lying between an image sensor and a light source, the image sensor lying in a detection plane, the method comprising:
a) illuminating the sample with the light source, the light source emitting an incident light wave that propagates along a propagation axis;
b) acquiring an image of the sample with the image sensor, the image comprising a plurality of elementary diffraction patterns, each elementary diffraction pattern corresponding to one particle;
c) on the basis of the acquired image, reconstructing a complex image representative of a complex amplitude of the exposure light wave on at least one reconstruction surface passing through the sample, the reconstruction being achieved by implementing an iterative reconstruction algorithm, the algorithm comprising, in each iteration, updating a phase of the exposure light wave in the detection plane or on the reconstruction surface;
d) selecting a region of interest of the complex image, the selected region of interest corresponding to a selected particle of interest;
e) forming an extracted complex image, the extracted complex image being extracted from the region of interest of the complex image selected in d);
f) applying a propagation operator to the extracted complex image formed in e), so as to obtain, in at least one propagation plane, an elementary diffraction pattern of the particle of interest selected in d), such that the elementary diffraction pattern obtained is isolated from elementary diffraction patterns of other particles present in the sample, the elementary diffraction pattern comprising interference fringes; and
g) characterizing the particle of interest depending on the elementary diffraction pattern resulting from f),
wherein g) comprises at least one of:
comparing the elementary diffraction pattern obtained in f), with at least one diffraction pattern corresponding to a known particle;
comparing the elementary diffraction pattern obtained in f), with at least one diffraction pattern modeled in view of a particle the refractive index and/or size of which are known; and
classifying the elementary diffraction pattern obtained in f), in view of diffraction patterns obtained using known particles or diffraction patterns modeled in a training phase.