US 12,134,713 B2
Classifying comparators based on comparator offsets
Zhi-Yuan Zou, Colorado Springs, CO (US)
Assigned to Microchip Technology Incorporated, Chandler, AZ (US)
Filed by Microchip Technology Incorporated, Chandler, AZ (US)
Filed on Mar. 6, 2019, as Appl. No. 16/294,467.
Claims priority of provisional application 62/786,015, filed on Dec. 28, 2018.
Prior Publication US 2020/0213139 A1, Jul. 2, 2020
Int. Cl. G01R 31/00 (2006.01); C08F 2/50 (2006.01); C08F 220/06 (2006.01); C08F 220/18 (2006.01); C08F 236/20 (2006.01); C08F 236/22 (2006.01); C08K 5/00 (2006.01); C08K 5/01 (2006.01); C08K 5/132 (2006.01); C08K 5/37 (2006.01); C08K 7/28 (2006.01); C09J 7/38 (2018.01); C09J 133/08 (2006.01); C09J 133/10 (2006.01); C09J 151/00 (2006.01); G01R 23/00 (2006.01); G01R 31/30 (2006.01); G01R 31/317 (2006.01); H04L 9/08 (2006.01); H04L 9/32 (2006.01)
CPC C09J 151/003 (2013.01) [C08F 2/50 (2013.01); C08F 220/06 (2013.01); C08F 220/1808 (2020.02); C08F 220/1811 (2020.02); C08F 236/20 (2013.01); C08F 236/22 (2013.01); C08K 5/0025 (2013.01); C08K 5/01 (2013.01); C08K 5/132 (2013.01); C08K 5/37 (2013.01); C08K 7/28 (2013.01); C09J 7/38 (2018.01); C09J 133/08 (2013.01); C09J 133/10 (2013.01); G01R 23/005 (2013.01); G01R 31/002 (2013.01); G01R 31/30 (2013.01); G01R 31/31709 (2013.01); G01R 31/31719 (2013.01); H04L 9/0866 (2013.01); H04L 9/3278 (2013.01); C09J 2203/00 (2013.01); C09J 2400/14 (2013.01); C09J 2400/22 (2013.01); C09J 2423/106 (2013.01); C09J 2423/166 (2013.01); G01R 31/31703 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A method, comprising;
applying, multiple times during a first phase of a comparator testing process, a same voltage to both of a first input and a second input of a comparator;
applying, multiple times during a second phase of the comparator testing process, an external offset voltage to the first and the second input of the comparator, a polarity exhibited by the external offset voltage opposite a polarity respectively exhibited by output signals generated by the comparator responsive to the same voltage applied multiple times during the first phase of the comparator testing process; and
generating an indication of reliability, wherein generating the indication of reliability comprises:
generating an indication of an unreliable comparator responsive to respective second output signals generated by the comparator responsive to the external offset voltage applied multiple times during the second phase of the comparator testing process exhibiting different polarity than the polarity respectively exhibited by output signals generated by the comparator responsive to the applied same voltage; or
generating an indication of a reliable comparator responsive to respective second output signals generated by the comparator responsive to the external offset voltage applied multiple times during the second phase of the comparator testing process exhibiting same polarity as the polarity respectively exhibited by output signals generated by the comparator responsive to the applied same voltage.