US 12,133,714 B2
Line excitation array detection microscopy
Adela Ben-Yakar, Austin, TX (US); Tianqi Li, Poway, CA (US); Chris Martin, Austin, TX (US); and Peisen Zhao, Austin, TX (US)
Assigned to BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM, Austin, TX (US)
Appl. No. 17/054,266
Filed by BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM, Austin, TX (US)
PCT Filed May 10, 2019, PCT No. PCT/US2019/031763
§ 371(c)(1), (2) Date Nov. 10, 2020,
PCT Pub. No. WO2019/217846, PCT Pub. Date Nov. 14, 2019.
Claims priority of provisional application 62/669,573, filed on May 10, 2018.
Prior Publication US 2021/0161385 A1, Jun. 3, 2021
Int. Cl. G02B 21/00 (2006.01); A61B 5/00 (2006.01); G01N 21/64 (2006.01)
CPC A61B 5/0071 (2013.01) [A61B 5/0082 (2013.01); G01N 21/6458 (2013.01); G02B 21/0036 (2013.01); G02B 21/0048 (2013.01); G02B 21/006 (2013.01); G02B 21/0072 (2013.01); G02B 21/0076 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A system for imaging of a subject of interest, comprising:
an optical beam source configured to provide an excitation beam;
one or more beam scanners configured for line scanning of the excitation beam across the subject; and
one or more linear arrays of optical detectors configured for parallel detection of optical signals from different segments of the subject in response to the excitation beam,
wherein the one or more beam scanners comprise an acousto-optic deflector (AOD) coupled to the optical beam source, and
wherein the AOD is comprised of a crystal in a longitudinal mode or a crystal in a shear mode.