US 12,464,398 B2
Method and apparatus for measuring frequency in wireless communication system
Donggun Kim, Suwon-si (KR); and Soenghun Kim, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Oct. 27, 2023, as Appl. No. 18/496,732.
Application 18/496,732 is a continuation of application No. 17/805,177, filed on Jun. 2, 2022, granted, now 11,805,437.
Application 17/805,177 is a continuation of application No. 16/826,015, filed on Mar. 20, 2020, granted, now 11,356,879, issued on Jun. 7, 2022.
Claims priority of application No. 10-2019-0032542 (KR), filed on Mar. 21, 2019.
Prior Publication US 2024/0064552 A1, Feb. 22, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. H04W 24/10 (2009.01); H04W 76/19 (2018.01); H04W 76/27 (2018.01); H04W 76/30 (2018.01)
CPC H04W 24/10 (2013.01) [H04W 76/19 (2018.02); H04W 76/27 (2018.02); H04W 76/30 (2018.02)] 18 Claims
OG exemplary drawing
 
1. A method performed by a user equipment (UE) for a frequency measurement in a wireless communication system, the method comprising:
receiving first frequency measurement configuration information;
transmitting, to a base station, a radio resource control (RRC) resume request message, while in an RRC inactive mode;
receiving, from the base station, an RRC release message in response to transmitting the RRC resume request message while in the RRC inactive mode;
in case that the RRC release message includes second frequency measurement configuration information, identifying whether the second frequency measurement configuration information includes a frequency measurement list to be measured during an idle state or an inactive state; and
in case that the second frequency measurement configuration information includes the frequency measurement list, performing the frequency measurement based on the frequency measurement list.