US 12,464,262 B2
Infrared imaging device and fixed pattern noise data generation method
Masaharu Hattori, Tokyo (JP)
Assigned to Mitsubishi Electric Corporation, Tokyo (JP)
Appl. No. 18/558,514
Filed by Mitsubishi Electric Corporation, Tokyo (JP)
PCT Filed Jun. 18, 2021, PCT No. PCT/JP2021/023136
§ 371(c)(1), (2) Date Nov. 1, 2023,
PCT Pub. No. WO2022/264390, PCT Pub. Date Dec. 22, 2022.
Prior Publication US 2024/0244348 A1, Jul. 18, 2024
Int. Cl. H04N 25/671 (2023.01); G01J 5/48 (2022.01); G01J 5/70 (2022.01); H04N 23/20 (2023.01); H04N 25/21 (2023.01); G01J 5/00 (2022.01)
CPC H04N 25/671 (2023.01) [G01J 5/48 (2013.01); G01J 5/70 (2022.01); H04N 23/20 (2023.01); H04N 25/21 (2023.01); G01J 2005/0074 (2013.01)] 9 Claims
OG exemplary drawing
 
1. An infrared imaging device, comprising:
an infrared imaging element configured to receive infrared light to capture a thermal image;
a temperature sensor configured to detect a temperature of the infrared imaging element;
a fixed pattern noise (FPN) memory configured to store therein fixed pattern noise data at each of temperatures of the infrared imaging element;
a frame memory configured to save a plurality of pieces of frame data composed of thermal images captured by the infrared imaging element in a fixed period of time; and
a data generator that, when an imaging target is determined not to have changed on a basis of the plurality of pieces of frame data saved in the frame memory, is configured to acquire from the FPN memory, the fixed pattern noise data corresponding to the temperature of the infrared imaging element at which said frame data were obtained; and configured to perform averaging processing between average values of the plurality of pieces of frame data and the thus-acquired fixed pattern noise data, to thereby regenerate the fixed pattern noise data in an updated manner.