US 12,462,718 B2
Display device and method for detecting data link line defect in display device
Jun-Yeob Lee, Gyeongsan-si (KR); Sang-Yong Woo, Daegu (KR); Sang-Bum Ko, Gumi-si (KR); and Man-Ki Ji, Daegu (KR)
Assigned to LG Display Co., Ltd, (KR)
Filed by LG Display Co., Ltd., Seoul (KR)
Filed on Aug. 28, 2020, as Appl. No. 17/006,457.
Claims priority of application No. 10-2019-0141734 (KR), filed on Nov. 7, 2019.
Prior Publication US 2021/0142702 A1, May 13, 2021
Int. Cl. G09G 3/36 (2006.01); G09G 3/00 (2006.01)
CPC G09G 3/006 (2013.01) [G09G 3/3688 (2013.01); G09G 2310/0297 (2013.01); G09G 2310/08 (2013.01); G09G 2330/12 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A display device comprising:
a display panel divided into a display area and a non-display area such that data lines and gate lines are arranged in the display area in an intersecting manner for defining pixels in a matrix;
a multiplexer disposed in the non-display area of the display panel at one side of the data lines and including a plurality of multiplexer switching elements;
an auto-probe (AP) test circuit disposed in the non-display area of the display panel at another side of the data lines; and
a data driver for supplying a data voltage to the data lines of the display panel through the multiplexer,
wherein the multiplexer and the AP test circuit detect defects of link lines respectively connected to the data lines,
wherein, before execution of a driving circuit mounting process, the AP test circuit inspects defects of the data lines of the display panel or defects of thin film transistors of the pixels, and detects the defects of the link lines respectively connected to the data lines,
wherein the AP test circuit comprises:
a plurality of AP pads; and
a plurality of AP switching elements having a one-to-one correspondence with the data lines such that each of the plurality of AP switching elements directly connects one of the data lines to one of the plurality of AP pads,
wherein the plurality of AP switching elements are turned on when an AP test and a defect inspection for the link lines are conducted,
wherein, when the defect inspection for the link lines is conducted, a positive (+) data voltage is applied to odd numbered AP pads among the plurality of AP pads, a negative (−) data voltage is applied to even numbered AP pads among the plurality of AP pads, and at least two of the plurality of multiplexer switching elements are turned on so that the positive (+) data voltage and the negative (−) data voltage are offset by each other through a short-circuit of the link lines, and
wherein each of the at least two of the plurality of multiplexer switching elements is connected to both the odd numbered AP pad applied with the positive (+) data voltage and the even numbered AP pad applied with the negative (−) data voltage through the data lines, and pixels connected to the data lines supplied with an offset voltage display a dark image.