US 12,462,527 B2
Method and device for classifying targets
Julia Nitsch, Hamburg (DE); Christian Fellenberg, Hamburg (DE); Thorbjörn Posewsky, Hamburg (DE); Jennifer Erdmann, Hamburg (DE); and Cornelia Hofsäss, Hamburg (DE)
Assigned to Microvision, Inc., Redmond, WA (US)
Appl. No. 18/023,647
Filed by Microvision, Inc., Redmond, WA (US)
PCT Filed Jul. 16, 2021, PCT No. PCT/EP2021/070009
§ 371(c)(1), (2) Date Feb. 27, 2023,
PCT Pub. No. WO2022/042940, PCT Pub. Date Mar. 3, 2022.
Claims priority of application No. 20193251 (EP), filed on Aug. 28, 2020.
Prior Publication US 2023/0316712 A1, Oct. 5, 2023
Int. Cl. G06V 10/00 (2022.01); G01S 17/89 (2020.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01)
CPC G06V 10/764 (2022.01) [G01S 17/89 (2013.01); G06V 10/82 (2022.01)] 20 Claims
OG exemplary drawing
 
1. A method for classifying targets, comprising:
obtaining measurement data from at least one receiving element of a sensor;
generating a photon histogram as a one-dimensional array from the measurement data;
converting the photon histogram into a two-dimensional image representation;
extracting features from the two-dimensional image representation of the photon histogram by means of a convolutional neuronal network or a Gaussian Mixture Model to obtain extracted features; and
classifying the targets based at least in part on the extracted features, wherein the extracted features comprise a shape of a peak in the two-dimensional image representation of the photon histogram, and wherein the classifying comprises distinguishing between object reflections and environmental condition reflections based on the extracted features.