US 12,461,989 B2
Correcting low-resolution measurements
Cheryl L. Pammer, San Diego, CA (US); and Robert E. Kelly, State College, PA (US)
Assigned to Minitab, LLC, State College, PA (US)
Filed by Minitab, LLC, State College, PA (US)
Filed on Nov. 19, 2021, as Appl. No. 17/531,206.
Prior Publication US 2023/0161837 A1, May 25, 2023
Int. Cl. G06F 17/18 (2006.01)
CPC G06F 17/18 (2013.01) 19 Claims
OG exemplary drawing
 
1. A method comprising:
measuring, using a low-resolution measurement device containing at least one sensor, a plurality of low-resolution measurements in a manufacturing process; the plurality of low-resolution measurements being quantitative measurements corresponding to a plurality of unobservable high-resolution measurements;
introducing variation in the plurality of low-resolution measurements by iteratively computing, until a termination criteria is met, corresponding perturbed values for the low-resolution measurements, said corresponding perturbed values having a higher resolution than the resolution of the low-resolution measurements; and
running, responsive to the introducing, a distribution test on final perturbed values that remain after said termination criteria is met
wherein the introducing comprises:
computing, for each low-resolution measurement, a first interval that contains a corresponding unobservable high-resolution measurement corresponding to said each low-resolution measurement;
generating, for each low-resolution measurement, a random observation from a uniform distribution on a defined interval;
transforming each random observation to be uniform on a second interval that corresponds to a distribution function of the first interval to obtain corresponding rescaled uniform observations, said distribution function being based on estimated distribution parameters of said low-resolution measurements; and
inverse transforming, responsive to the transforming, and using an inverse of the distribution function, said rescaled uniform observations to obtain said corresponding perturbed values,
wherein the transforming and inverse transforming are repeated iteratively using new estimated distribution parameters of the corresponding perturbed values until said termination criteria is met.