US 12,461,693 B2
Temperature monitoring for memory devices
Aaron P. Boehm, Boise, ID (US); Todd Jackson Plum, Boise, ID (US); Scott D. Van De Graaff, Boise, ID (US); Scott E. Schaefer, Boise, ID (US); and Mark D. Ingram, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Apr. 10, 2024, as Appl. No. 18/632,049.
Application 18/632,049 is a continuation of application No. 17/464,333, filed on Sep. 1, 2021, granted, now 11,977,772.
Claims priority of provisional application 63/084,240, filed on Sep. 28, 2020.
Prior Publication US 2024/0256187 A1, Aug. 1, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0659 (2013.01) [G06F 3/0604 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A memory device, comprising:
one or more memory arrays; and
one or more controllers coupled with the one or more memory arrays and configured to cause the memory device to:
receive, while the memory device operates over one or more power cycles, a plurality of temperatures from one or more temperature sensors of the memory device;
determine, for each temperature and a corresponding temperature range of a plurality of temperature ranges, each temperature range of the plurality of temperature ranges being associated with a respective counter of a plurality of counters, a corresponding time duration over the one or more power cycles that the memory device is operating within the corresponding temperature range by incrementing a respective counter of the plurality of counters associated with the corresponding temperature range by a value indicating the corresponding time duration, wherein incrementing the respective counter by the value comprises accumulating a count of signal transitions of an oscillating signal, the count corresponding to the value indicating the corresponding time duration;
scale a signal frequency of the oscillating signal based at least in part on the corresponding temperature range, wherein determining the corresponding time duration is based at least in part on the scaling; and
store the values associated with the plurality of counters at a storage component associated with the memory device.