US 12,461,354 B2
Point-scanning structured illumination-based super-resolution microscopic imaging system and method
Yonghong Shao, Shenzhen (CN); Xiaomin Zheng, Shenzhen (CN); and Meiting Wang, Shenzhen (CN)
Assigned to SHENZHEN UNIVERSITY, Shenzhen (CN)
Filed by SHENZHEN UNIVERSITY, Shenzhen (CN)
Filed on Aug. 7, 2023, as Appl. No. 18/366,357.
Application 18/366,357 is a continuation of application No. PCT/CN2021/108962, filed on Jul. 28, 2021.
Claims priority of application No. 202010788137.3 (CN), filed on Aug. 7, 2020.
Prior Publication US 2023/0384572 A1, Nov. 30, 2023
Int. Cl. G02B 21/00 (2006.01)
CPC G02B 21/0076 (2013.01) [G02B 21/0032 (2013.01); G02B 21/0072 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A point-scanning structured illumination-based microscopic imaging system, comprising:
a first laser assembly;
a second laser assembly;
a scanner;
a detector; and
a computing terminal;
wherein the first laser assembly is configured to generate an excitation light whose intensity varies sinusoidally with time;
the second laser assembly is configured to generate an annular stimulated emission depletion (STED) light;
the scanner is configured to control the excitation light and the annular STED light to scan and excite a to-be-imaged sample to generate fluorescence signals;
the detector is configured to acquire the fluorescence signals to obtain a plurality of fluorescence-structured images in different orientations and phase; and
the computing terminal is configured to extract a frequency component of each of the plurality of fluorescence-structured images, reconstruct a plurality of local super-resolution images of the to-be-imaged sample in different orientations based on the frequency component, and synthesize an integral super-resolution image of the to-be-imaged sample based on the plurality of local super-resolution images.