US 12,461,124 B2
Contact pin and socket for inspection
Junichi Miyaaki, Tokyo (JP)
Assigned to YAMAICHI ELECTRONICS CO., LTD., Tokyo (JP)
Filed by Yamaichi Electronics Co., Ltd., Tokyo (JP)
Filed on Jul. 11, 2023, as Appl. No. 18/220,319.
Claims priority of application No. 2022-111827 (JP), filed on Jul. 12, 2022.
Prior Publication US 2024/0019461 A1, Jan. 18, 2024
Int. Cl. G01R 1/067 (2006.01); G01R 1/04 (2006.01)
CPC G01R 1/06716 (2013.01) [G01R 1/0466 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A contact pin comprising a plurality of electrically conductive contacts, each of the contacts extending from a base end to a tip and having an elastic deformation part formed between the base end and the tip, and the elastic deformation part being elastically expandable and compressible in an extending direction,
wherein the plurality of contacts are laterally stacked adjacent to each other in a direction orthogonal to the extending direction and are movable independently of each other in the extending direction, and
wherein the contacts adjacent to each other are directly in contact with each other in a stack direction.