US 12,461,068 B2
System and method for hole inspection and qualification
Stuart Chaplan, Marlborough, MA (US); Neil Goldfine, Cocoa Beach, FL (US); and Zachary M. Thomas, Pittsburgh, PA (US)
Assigned to JENTEK Sensors, Inc., Marlborough, MA (US)
Filed by JENTEK Sensors, Inc., Marlborough, MA (US)
Filed on Apr. 27, 2022, as Appl. No. 17/660,979.
Claims priority of provisional application 63/180,317, filed on Apr. 27, 2021.
Prior Publication US 2022/0341875 A1, Oct. 27, 2022
Int. Cl. G01N 27/9013 (2021.01)
CPC G01N 27/902 (2013.01) 1 Claim
OG exemplary drawing
 
1. A method of determining performance of a hole inspection system, the method comprising acts of:
(i) providing a test set of inspection plates, each plate in the test set having a plurality of test holes symmetric about a first axis of said plate, a first plate in the test set having a defect feature at a first test hole among its plurality of test holes;
(ii) securing with an alignment tool a first subset of plates in the test set into a first test specimen such that corresponding test holes on each plate in the first subset are axially aligned, the first subset of plates including the first plate;
(iii) performing an eddy current inspection procedure with the hole inspection system in each of the plurality of test holes in the first test specimen;
(iv) storing inspection results for each of the plurality of test holes in the first test specimen;
(v) determining performance of the hole inspection system based at least in part on whether the results detected the defect feature in the first test hole of the first plate;
(vi) securing with the alignment tool a second subset of plates in the test set into a second test specimen, wherein
the second subset of plates includes plate common to both the first and second subsets of plates,
a plate in the second subset of plates is absent from the first subset of plates; and
the second subset of plates is different from the first subset in at least one of (a) the plate common to both the first and second subsets of plates is rotated about its first axis in the second test specimen relative to the first test specimen, and (b) the plate common to both the first and second subsets of plates is flipped over in the second test specimen relative to the first test specimen; and
(vii) repeating acts (iii) and (iv) for the second test specimen,
wherein act (v) is performed based on inspection results from both the first and second test specimens.