| CPC G01N 22/00 (2013.01) [G01N 33/025 (2013.01); H01P 7/10 (2013.01)] | 18 Claims |

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1. A device for dielectric material characterization of a test sample comprising:
a resonator block comprising a groove formed on at least one side of the resonator block, wherein the groove comprises at least a first inclined surface and a second inclined surface and is configured to contact the test sample via the first inclined surface and/or the second inclined surface,
wherein the resonator block is configured to generate a rotational electric field coupled between the first inclined surface and the second inclined surface of the groove and further to propagate the rotational electric field partially or fully through the test sample in order to perform dielectric material characterization of the test sample,
wherein the device further comprises a ground plane, a dielectric base arranged on the ground plane, and wherein the resonator block comprises a quasi-cubic dielectric resonator arranged near or on the dielectric base, and a buried metal line conductively coupled to the ground plane arranged near or at a center of the dielectric resonator perpendicular to the ground plane, whereby the dielectric resonator further comprises the groove positioned at one side of the dielectric resonator, and
wherein the dielectric resonator is configured to generate an electric field, whereby the buried metal line is configured to circulate the electric field within the dielectric resonator, thereby generating the rotational electric field.
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