US 12,458,327 B2
Ultrasonic device, semiconductor device, and method of controlling ultrasonic device
Naoto Adachi, Yokohama (JP); Naoto Yoneda, Yokohama (JP); and Masaya Tamamura, Yokohama (JP)
Assigned to ABLIC INC., Nagano (JP)
Filed by Socionext Inc., Kanagawa (JP)
Filed on May 4, 2023, as Appl. No. 18/312,332.
Application 18/312,332 is a continuation of application No. PCT/JP2020/042629, filed on Nov. 16, 2020.
Prior Publication US 2023/0270419 A1, Aug. 31, 2023
Int. Cl. A61B 8/00 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01)
CPC A61B 8/58 (2013.01) [A61B 8/4488 (2013.01); A61B 8/5207 (2013.01); G01S 7/5208 (2013.01); G01S 15/8915 (2013.01)] 1 Claim
OG exemplary drawing
 
1. A method of controlling an ultrasonic device that includes:
a plurality of oscillation elements configured to generate ultrasonic waves toward a subject, and generate voltages according to ultrasonic waves reflected by the subject,
a switch configured to select voltages generated by a first predetermined number of oscillation elements, from among the voltages generated by the plurality of oscillation elements, and
a plurality of semiconductor devices,
the method being executed by each of the plurality of semiconductors, comprising:
receiving a second predetermined number of voltages different from voltages received by other semiconductor devices, among a first predetermined number of voltages selected by the switch;
generating a second predetermined number of sets of time-series data, each of the sets indicating change in time of the received second predetermined number of voltages;
extracting sets of data of predetermined amounts of delays from the generated second predetermined number of sets of time-series data, respectively;
adding the extracted sets of data of the predetermined amounts of delays;
receiving addition results of data of the other semiconductor devices;
adding the addition result of data of said each of the plurality of semiconductors and the addition results of the data of the other semiconductor devices; and
generating image data based on the addition result of the data of said each of the plurality of semiconductors and the addition results of the data of the other semiconductor devices.