US 12,132,262 B2
Machine learning-based antenna array validation, prototyping and optimization
Aidan Smyth, Meath (IN); Kiran Uln, Pleasanton, CA (US); Victor Simileysky, San Jose, CA (US); and Zhuohui Zhang, Tustin, CA (US)
Assigned to Cypress Semiconductor Corporation, San Jose, CA (US)
Filed by Cypress Semiconductor Corporation, San Jose, CA (US)
Filed on Apr. 8, 2022, as Appl. No. 17/716,888.
Application 17/716,888 is a continuation of application No. 16/584,383, filed on Sep. 26, 2019, granted, now 11,303,041.
Claims priority of provisional application 62/878,232, filed on Jul. 24, 2019.
Prior Publication US 2022/0294126 A1, Sep. 15, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. H04B 7/02 (2018.01); H01Q 3/26 (2006.01); H01Q 21/24 (2006.01); H04L 27/36 (2006.01)
CPC H01Q 21/24 (2013.01) [H01Q 3/2605 (2013.01); H04L 27/362 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
receiving, by one or more processors, a plurality of data points indicative of magnitude and phase of a radio frequency (RF) signal for each antenna element of a plurality of antenna elements comprised by an antenna array;
clustering, by the one or more processors, the plurality of data points into a plurality of clusters;
computing, by the one or more processors, an angular resolution value of the antenna array based on a comparison between a first value corresponding to a first cluster of the plurality of clusters and a second value corresponding to a second cluster of the plurality of clusters; and
outputting, by the one or more processors, the angular resolution value.