US 12,130,341 B2
Method and apparatus for measuring magnetic field and temperature using diamond nitrogen vacancy sensor
Jeong Hyun Shim, Daejeon (KR); Sang Won Oh, Daejeon (KR); Ki Woong Kim, Daejeon (KR); and Kwang Geol Lee, Seoul (KR)
Assigned to KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE, Daejeon (KR)
Filed by KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE, Daejeon (KR)
Filed on Nov. 21, 2022, as Appl. No. 17/991,087.
Prior Publication US 2024/0168106 A1, May 23, 2024
Int. Cl. G01R 33/032 (2006.01); G01R 33/00 (2006.01)
CPC G01R 33/032 (2013.01) [G01R 33/0017 (2013.01); G01R 33/0082 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A measuring apparatus based on a diamond nitrogen-vacancy center (DNV) sensor, comprising:
a diamond nitrogen-vacancy center sensor;
a frequency synthesizer for generating a first reference signal and a second reference signal;
a first microwave generator for generating a first microwave that is frequency modulated according to the first reference signal and causes a first spin transition in the diamond nitrogen-vacancy center sensor;
a second microwave generator for generating a second microwave that is frequency modulated according to the second reference signal and causes a second spin transition in the diamond nitrogen-vacancy center sensor;
a laser irradiator for applying a laser to excite a spin state of the diamond nitrogen-vacancy center sensor;
a power amplifier for combining and amplifying the first microwave and the second microwave to apply to the diamond nitrogen-vacancy center sensor;
a detector for detecting a fluorescence signal output from the diamond nitrogen-vacancy center sensor;
a reference detector for measuring power of the laser;
a differential circuit for outputting a difference between an output signal of the detector and an output signal of the reference detector;
a first lock-in amplifier for outputting a result of comparing an output of the differential circuit with the first reference signal, and
a second lock-in amplifier for outputting a result of comparing an output of the differential circuit with the second reference signal.