US 12,130,325 B2
Electronic device and operation method of electronic device for detecting crack of signal line
Myeongjae Hong, Suwon-si (KR); Junwhon Uhm, Suwon-si (KR); Duckjin Kim, Suwon-si (KR); Hyunmo Yang, Suwon-si (KR); Yongseob Yun, Suwon-si (KR); and Junmyeong Jeong, Suwon-si (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Jul. 7, 2022, as Appl. No. 17/859,589.
Application 17/859,589 is a continuation of application No. PCT/KR2022/009530, filed on Jul. 1, 2022.
Claims priority of application No. 10-2021-0090145 (KR), filed on Jul. 9, 2021.
Prior Publication US 2023/0008917 A1, Jan. 12, 2023
Int. Cl. G01R 31/28 (2006.01); H05K 1/02 (2006.01); H05K 1/14 (2006.01)
CPC G01R 31/2812 (2013.01) [G01R 31/2813 (2013.01); H05K 1/0243 (2013.01); H05K 1/028 (2013.01); H05K 1/14 (2013.01)] 23 Claims
OG exemplary drawing
 
1. An electronic device comprising:
a first circuit board;
a second circuit board;
a signal line connecting the first circuit board and the second circuit board;
a processor disposed on the first circuit board and configured to output a pulse signal through the signal line;
a parasitic capacitance pattern disposed around the signal line and configured to generate a parasitic capacitance by the pulse signal; and
an amplifier disposed on the second circuit board and configured to amplify a signal generated by the parasitic capacitance,
wherein the processor is configured to identify whether the signal line is abnormal, based on the amplified signal obtained from the amplifier.